Published April 24, 2014
| Version v1
Journal article
Synchrotron based X-ray fluorescence activities at Indus-2: An overview
Creators
- 1. Indus Synchrotrons Utilisation Division, Raja Ramanna Centre for Advanced Technology, Indore-452013 (India)
Description
X-Ray fluorescence (XRF) spectrometry is a powerful non-destructive technique for elemental analysis of materials at bulk and trace concentration levels. Taking into consideration several advantages of the synchrotron based XRF technique and to fulfill the requirements of Indian universities users we have setup a microfocus XRF beamline (BL-16) on Indus-2 synchrotron light source. The beamline offers a wide range of usages – both from research laboratories and industries; and for researchers working in diverse fields. A brief overview of the measured performance of the beamline, design specifications including various attractive features and recent research activities carried out on the BL-16 beamline are presented
Additional details
Identifiers
- DOI
- 10.1063/1.4872474;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1591
- Journal Issue
- 1
- Journal Page Range
- p. 13-17
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 58. DAE solid state physics symposium 2013
- Dates
- 17-21 Dec 2013
- Place
- Patiala, Punjab (India)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45090551
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- FLUORESCENCE; INDUS-2; LIGHT SOURCES; SPECTROSCOPY; SYNCHROTRONS; X RADIATION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ACCELERATORS; CHEMICAL ANALYSIS; CYCLIC ACCELERATORS; ELECTROMAGNETIC RADIATION; EMISSION; IONIZING RADIATIONS; LUMINESCENCE; NONDESTRUCTIVE ANALYSIS; PHOTON EMISSION; RADIATION SOURCES; RADIATIONS; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC