Published July 1, 2002 | Version v1
Journal article

Cooperative Jahn-Teller transition and resonant x-ray scattering in thin film LaMnO3

  • 1. Department of Physics and Electron Spin Science Center, Pohang University of Science and Technology, Pohang, 790-784 (Korea, Republic of)
  • 2. Pohang Accelerator Laboratory, Pohang University of Science and Technology, Pohang, 790-784 (Korea, Republic of)

Description

Epitaxial thin films of stoichiometric LaMnO3 were grown on SrTiO3(110) and MgO(110) substrates. The cooperative Jahn-Teller (JT) transition was found to occur at TJT=573.0 and 670.0 K for films on SrTiO3 and MgO, respectively. Extended x-ray-absorption fine structure, and resonant x-ray scattering intensity of the orthorhombic (100) peaks near the Mn K-edge were measured from low temperatures to above TJT. We demonstrate that the integrated intensity of the resonant x-ray peak is proportional to the 3/2 power of the orthorhombic lattice strain as well as local bond orthorhombicity at all temperatures for both films. This proves that the band effect associated with the JT distortion accounts for the Mn K-edge resonant scattering in LaMnO3

Additional details

Publishing Information

Journal Title
Physical Review. B, Condensed Matter and Materials Physics
Journal Volume
66
Journal Issue
2
Journal Page Range
p. 020407-020407.4
ISSN
1098-0121

Optional Information

Notes
(c) 2002 The American Physical Society