Published November 1992 | Version v1
Report Open

Cross-sectional TEM studies of DIGM in irradiated Au-Cu bilayers

Description

Cross-sectional transmission electron microscopy was used to study diffusion-induced gain boundary migration (DIGM) in irradiated and annealed Au/Cu bilayers. Using this technique, in combination with small probe x-ray energy dispersive spectroscopy, DIGM alloyed zones in Au were identified in an irradiated sample

Availability note (English)

MF available from INIS under the Report Number; OSTI as DE93005552; NTIS; INIS; US Govt. Printing Office Dep.

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Additional details

Publishing Information

Imprint Pagination
7 p.
Report number
ANL/MSD/CP--76616

Conference

Title
16. Material Research Society international symposium on the scientific basis for nuclear waste management fall meeting.
Dates
30 Nov - 5 Dec 1992.
Place
Boston, MA (United States).

Optional Information

Contract/Grant/Project number
Contract W-31109-ENG-38
Funding organization
USDOE, Washington, DC (United States).
Secondary number(s)
CONF-921101--42.