Published November 1992
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Cross-sectional TEM studies of DIGM in irradiated Au-Cu bilayers
Description
Cross-sectional transmission electron microscopy was used to study diffusion-induced gain boundary migration (DIGM) in irradiated and annealed Au/Cu bilayers. Using this technique, in combination with small probe x-ray energy dispersive spectroscopy, DIGM alloyed zones in Au were identified in an irradiated sample
Availability note (English)
MF available from INIS under the Report Number; OSTI as DE93005552; NTIS; INIS; US Govt. Printing Office Dep.Files
24037566.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 7 p.
- Report number
- ANL/MSD/CP--76616
Conference
- Title
- 16. Material Research Society international symposium on the scientific basis for nuclear waste management fall meeting.
- Dates
- 30 Nov - 5 Dec 1992.
- Place
- Boston, MA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24037566
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COPPER; DIFFUSION; ELECTRON DIFFRACTION; GOLD; GRAIN BOUNDARIES; ION BEAMS; KRYPTON IONS; LAYERS; MEV RANGE 01-10; PHYSICAL RADIATION EFFECTS; TRANSMISSION ELECTRON MICROSCO; X-RAY SPECTROSCOPY; ZONES
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; IONS; METALS; MEV RANGE; MICROSCOPY; MICROSTRUCTURE; RADIATION EFFECTS; SCATTERING; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Contract/Grant/Project number
- Contract W-31109-ENG-38
- Funding organization
- USDOE, Washington, DC (United States).
- Secondary number(s)
- CONF-921101--42.