Published January 2011
| Version v1
Journal article
Structural and Magnetic Ordering in Fe-Ga Thin Films Examined by Moessbauer Spectrometry
Creators
- 1. Department of Physics, Technical University of Radom, Krasickiego 54, 26-600 Radom (Poland)
- 2. Department of Engineering Materials, University of Shefield, Shefield, S1 3JD (United Kingdom)
Description
The detailed analysis of atomic and magnetic structure has been performed by Moessbauer spectroscopy for polycrystalline Fe80Ga20 films of different thickness ranging from 20 nm to 200 nm. The films were deposited on Si(100) substrate using dual sputtering and evaporation method. Obtained CEMS spectra have been fitted with several Gaussian distributions of hyperfine magnetic field. The results point to the domination of BCC disordered A2 phase and the absence of DO3 and L12 phases in the films. Both hyperfine parameters and lattice constant reveal anomaly for 40 nm thick sample - presumably due to the change of the internal stress. Spin texture evolves from in-plane to out-of-the-plane configuration with increasing thickness. (authors)
Availability note (English)
Also available at http://przyrbwn.icm.edu.pl/APP/PDF/119/a119z1p06.pdfAdditional details
Additional titles
- Augmented title (English)
- PACS: 75.50.Bb, 75.70.Ak, 76.80.+y
Identifiers
Publishing Information
- Journal Title
- Acta Physica Polonica. Series A (Online)
- Journal Volume
- 119
- Journal Issue
- 1
- Journal Page Range
- p. 21-23
- ISSN
- 1898-794X
Conference
- Title
- All-Polish Seminar on Moessbauer Spectroscopy
- Dates
- 18-21 Jun 2010
- Place
- Warsaw (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 42099462
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; GALLIUM ALLOYS; IRON ALLOYS; LATTICE PARAMETERS; MAGNETIC PROPERTIES; MOESSBAUER EFFECT; MOLECULAR STRUCTURE; POLYCRYSTALS; SILICON; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELEMENTS; FILMS; MICROSCOPY; PHYSICAL PROPERTIES; SCATTERING; SEMIMETALS; TRANSITION ELEMENT ALLOYS
Optional Information
- Notes
- 11 refs., 4 figs.