Published April 15, 2001
| Version v1
Journal article
Some aspects of detectors and electronics for X-ray fluorescence analysis
Description
This paper presents some of the less recognized and potentially important parameters of the electronics and detectors used in X-ray fluorescence spectrometers. Detector factors include window (dead-layer) effects, time-dependent background and excess background. Noise parameters of field-effect transistors and time-variant pulse shaping are also discussed. (Auth.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods
- Journal Volume
- 142
- Journal Issue
- 1-2
- Series
- Nucl. Instrum. Methods.
- Journal Page Range
- 213-223
Conference
- Title
- International conference on particle induced X-ray emission and its analytical applications.
- Dates
- 23 - 26 Aug 1976.
- Place
- Lund, Sweden.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 8327489
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMPLIFIERS; BACKGROUND NOISE; ENERGY RESOLUTION; FIELD EFFECT TRANSISTORS; GAIN; GE SEMICONDUCTOR DETECTORS; LOW TEMPERATURE; PULSE SHAPERS; SI SEMICONDUCTOR DETECTORS; STABILITY; TIME DEPENDENCE; TRAPPING; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTRA
- Descriptors DEC
- CHEMICAL ANALYSIS; ELECTRONIC CIRCUITS; MEASURING INSTRUMENTS; NOISE; NONDESTRUCTIVE ANALYSIS; PULSE CIRCUITS; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SPECTRA; TRANSISTORS; X-RAY EMISSION ANALYSIS