Published October 1981 | Version v1
Journal article Metadata-only

Double focusing at Ar ion reflection from copper monocrystal

Creators

  • 1. Moskovskij Gosudarstvennyj Univ. (USSR)

Description

Computer calculation of 1.4-5.5 keV Ar ion reflection from a semichannel <110> of Cu monocrystal was carried out. It is shown that one of the mechanisms of focusing effect of the semichannel is double focusing when concentration of incident ions at the channel inlet and focusing of scattered ions during their escape from the channel take place. Influence of the initial ion energy, thermal oscillations of lattice atoms and the form of the ion-atom interaction potential on the effect of double focusing was studied

Additional details

Additional titles

Original title (Russian)
Двойная фокусировка при отражении ионов Ар от монокристалла меди

Publishing Information

Journal Title
Fiz. Tverd. Tela
Journal Volume
23
Journal Issue
10
Series
Fiz. Tverd. Tela.
Journal Page Range
2952-2955
ISSN
0367-3294

INIS

Country of Publication
Russian Federation
Country of Input or Organization
USSR
INIS RN
13700967
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ANGULAR DISTRIBUTION; ARGON IONS; COMPUTERIZED SIMULATION; COPPER; FOCUSING; ION CHANNELING; ION IMPLANTATION; KEV RANGE 01-10; LATTICE VIBRATIONS; MEDIUM TEMPERATURE; MONOCRYSTALS; REFLECTION
Descriptors DEC
CHANNELING; CHARGED PARTICLES; CRYSTALS; DISTRIBUTION; ELEMENTS; ENERGY RANGE; IONS; KEV RANGE; METALS; SIMULATION; TRANSITION ELEMENTS

Optional Information

Notes
for English translation see the journal Soviet Physics - Solid State (USA). For English translation see the journal Soviet Physics - Solid State (USA).