Gamma ray flaw detection system

This patent describes in a system for non-destructive examination of a test object by irradiation thereof from a monoenergetic source emitting a collimated beam of radiation and detection of scattered radiation emerging from the irradiated test object within a measurement field to provide scattered radiation density distribution profiles of the field from measurement of energy levels therein, a method of analyzing the detection of flaws in the irradiated test object. The method includes: comparing the radiation density distribution profiles with a reference profile corresponding to measured energy levels of scattered radiation emerging from an irradiated flawless object to provide differential spectra of the field; determining spatial relationships of the measured energy levels in the field relative to the beam of radiation; and extracting location and size data of the flaws in the test object from the differential spectra by data transformation thereof in accordance with the determined spatial relationships