Published February 1, 2015
| Version v1
Journal article
Scintillation properties of Ce:(La,Gd)2Si2O7 at high temperatures
Creators
- 1. New Industry Creation Hatchery Center (NICHe), Tohoku University, 6-6-10 Aoba, Aramaki, Aoba-ku, Sendai 980-8579, Miyagi (Japan)
- 2. Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Miyagi (Japan)
- 3. Institute of Physics, AS CR, Cukrovarnická 10, 162 53 Prague (Czech Republic)
- 4. C and A Corporation, 6-6-40 Aoba, Aramaki, Aoba-ku, Sendai, Miyagi 980-8577 (Japan)
Description
Temperature dependence of scintillation properties was investigated for (Ce0.01, Gd0.90, La0.09)2Si2O7 grown by floating zone method. The light output over 35,000 photons/MeV was found constant in the temperature range from 0 °C to 150 °C. In addition, FWHM energy resolution of Ce:La-GPS (roughly 7–8%) at 662 keV remained constant up to 100 °C. Thus, this crystal can be applied to oil well logging or other radiation detection application at high temperature conditions
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2014.10.008Additional details
Identifiers
- DOI
- 10.1016/j.nima.2014.10.008;
- PII
- S0168-9002(14)01155-3;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 772
- Journal Page Range
- p. 72-75
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46125516
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CRYSTALS; ENERGY RESOLUTION; GLOBAL POSITIONING SYSTEM; KEV RANGE 100-1000; MEV RANGE; OILS; PHOSPHORS; PHOTONS; RADIATION DETECTION; SCINTILLATIONS; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0400-1000 K; WELL LOGGING
- Descriptors DEC
- BOSONS; DETECTION; ELEMENTARY PARTICLES; ENERGY RANGE; KEV RANGE; MASSLESS PARTICLES; ORGANIC COMPOUNDS; OTHER ORGANIC COMPOUNDS; RESOLUTION; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.