Published March 2005 | Version v1
Journal article

Coherent X-rays as a new probe for the investigation of the dynamics of opaque colloidal suspensions

  • 1. European Synchrotron Radiation Facility, 6, rue Jules Horowitz, BP 220, F-38043 Grenoble, Cedex 9 (France)
  • 2. Physikalische Chemie, Universitaet des Saarlandes, Im Stadtwald, D-66123 Saarbruecken (Germany)
  • 3. Wallburg Realschule, Oskar-Serrand Str. 29, D-97483 Eltmann (Germany)
  • 4. Deutsches Elektronen Synchrotron (HASYLAB), Notkestr. 85, D- 22607, Hamburg (Germany)

Description

Third generation synchrotron radiation sources open up the possibility of using the coherence properties of the produced X-ray beam. The novel X-ray photon correlation spectroscopy (XPCS) technique probes slow dynamics of disordered material in overcoming the limitations usually occurring using photon correlation spectroscopy with coherent visible light. It is extending the accessible Q-range to short wavelength density fluctuations and is not sensitive to multiple scattering effects; thus allowing the investigation of the dynamics of opaque materials such as magnetic colloidal suspensions

Additional details

Identifiers

DOI
10.1016/j.jmmm.2004.11.014;
PII
S0304-8853(04)01239-9;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
289
Journal Page Range
p. 47-49
ISSN
0304-8853
CODEN
JMMMDC

Conference

Title
10. international conference on magnetic fluids
Acronym
ICMF10
Dates
2-6 Aug 2004
Place
Sao Paulo (Brazil)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37024686
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
FLUCTUATIONS; LIQUIDS; MAGNETIC MATERIALS; MULTIPLE SCATTERING; PHOTONS; SPECTROSCOPY; SUSPENSIONS; SYNCHROTRON RADIATION SOURCES; VISIBLE RADIATION; X RADIATION
Descriptors DEC
BOSONS; DISPERSIONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FLUIDS; IONIZING RADIATIONS; MASSLESS PARTICLES; MATERIALS; RADIATION SOURCES; RADIATIONS; SCATTERING; VARIATIONS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.