Published June 2005 | Version v1
Journal article

Azimuthal dependence of X-ray reflectivity in the vicinity of the S K-edge in hexagonal CdS crystal

  • 1. Institute of Physics, St. Petersburg University, St. Petersburg 198904 (Russian Federation) and Lab. Pour l'Utilisation du Rayonnement Electromagnetique, Universite Paris Sud, Orsay (France)
  • 2. Lab. Pour l'Utilisation du Rayonnement Electromagnetique, Universite Paris Sud, Orsay (France)
  • 3. Lab. de Chimie Physique., Universite Pierre et Marie Curie/CNRS UMR 7614, 75231 Paris (France)
  • 4. Institute of Physics, St. Petersburg University, St. Petersburg 198904 (Russian Federation)

Description

Reflection spectra for an hexagonal CdS crystal are measured near the S K-absorption edge at the grazing angle θ = 0.8 deg. with the help of s-polarised radiation for a surface cut parallel to the crystallographic c-axis for various Azimuthal orientations with respect to the electric field vector E. The experimental confirmation of the theoretically predicted strong focusing effect for the polarisation E perpendicular c is obtained for the first time

Additional details

Identifiers

DOI
10.1016/j.elspec.2005.01.207;
PII
S0368-2048(05)00272-0;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
144-147
Journal Page Range
p. 933-935
ISSN
0368-2048
CODEN
JESRAW

Conference

Title
14. international conference on vacuum ultraviolet radiation physics
Acronym
VUV 14
Dates
19-23 Jul 2004
Place
Cairns (Australia)

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.