Published September 1975 | Version v1
Journal article Metadata-only

Determination and improvement of parameters effecting a resolution of x-ray spectrometers

Creators

  • 1. Magyar Tudomanyos Akademia Atommag Kutato Intezete, Debrecen

Description

no abstract available

Additional details

Additional titles

Original title (Russian)
Определение и улучшение параметров, влияющих на разрешающую способност' спектрометра рентгеновского излучения

Publishing Information

Journal Title
Prib. Tekh. Ehksp.
Journal Issue
no.5
Series
Prib. Tekh. Ehksp.

INIS

Country of Publication
USSR
Country of Input or Organization
USSR
INIS RN
8307480
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
No Abstract
Descriptors DEI
FIELD EFFECT TRANSISTORS; HIGH VACUUM; LI-DRIFTED SI DETECTORS; NOISE; OPTIMIZATION; PREAMPLIFIERS; RESOLUTION; SOFT X RADIATION; SPECTRA; VERY LOW TEMPERATURE; X-RAY SPECTROMETERS
Descriptors DEC
AMPLIFIERS; ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; IONIZING RADIATIONS; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SI SEMICONDUCTOR DETECTORS; SPECTROMETERS; TRANSISTORS; X RADIATION

Optional Information

Notes
Published in summary form only; for English translation see the journal Instrum. Exp. Tech.