Published June 2006
| Version v1
Journal article
Surface modification of mica due to titanium sputtering as studied by positron annihilation
- 1. Saha Institute of Nuclear Physics, 1/AF BidhanNagar, Kolkata-700064 (India)
- 2. High Energy Accelerator Research Organization (KEK), Tsukuba, Ibaraki 305-0801 (Japan)
Description
Study was conducted of surface structural modification of layered sheets of mica that had been subjected to titanium (Ti) sputter coating, use being made of a variable but mono energetic slow positron beam. Comparison has been drawn with the structure of pure muscovite mica sheet. Doppler broadening (DB) of the energy of annihilation radiation has been used as a parameter to assay changes in the surface characteristics within a depth profile of 500 A. In support of these investigations, X-ray reflectivity data was used to assay titanium film thickness and the electron density profile of the film on mica. Finally, changes involving the surface micro-morphology of the system have been corroborated by scanning electron microscopy
Additional details
Identifiers
- DOI
- 10.1016/j.apradiso.2005.12.005;
- PII
- S0969-8043(05)00398-2;
Publishing Information
- Journal Title
- Applied Radiation and Isotopes
- Journal Volume
- 64
- Journal Issue
- 6
- Journal Page Range
- p. 651-655
- ISSN
- 0969-8043
- CODEN
- ARISEF
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37074137
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES;
- Descriptors DEI
- ANNIHILATION; DEPTH; DOPPLER BROADENING; ELECTRON DENSITY; MODIFICATIONS; MUSCOVITE; POSITRON BEAMS; POSITRONS; REFLECTIVITY; SCANNING ELECTRON MICROSCOPY; SHEETS; SILICATES; SPUTTERING; SURFACES; TITANIUM; X RADIATION
- Descriptors DEC
- ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; BEAMS; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; INTERACTIONS; IONIZING RADIATIONS; LEPTON BEAMS; LEPTONS; LINE BROADENING; MATTER; METALS; MICA; MICROSCOPY; MINERALS; OPTICAL PROPERTIES; OXYGEN COMPOUNDS; PARTICLE BEAMS; PARTICLE INTERACTIONS; PHYSICAL PROPERTIES; RADIATIONS; SILICATE MINERALS; SILICON COMPOUNDS; SURFACE PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.