Published 1987
| Version v1
Miscellaneous
Formation of Zr oxide in the electrolitic process and the distribution of dopants - An analysis by Rutherford backscattering
Creators
- 1. Pontificia Univ. Catolica do Rio de Janeiro (Brazil). Dept. de Fisica
- 2. Texas A and M Univ., College Station (USA). Dept. of Chemistry
Description
Published in summary form only
Additional details
Additional titles
- Original title (Portuguese)
- Formacao do oxido de Zr no processo eletrolitico e a distribuicao de dopantes - Uma analise por retroespalhamento de Rutherford
Publishing Information
- Imprint Title
- Proceedings of the 10. Workshop on Nuclear Physics in Brazil
- Imprint Pagination
- 172 p.
- Journal Page Range
- p. 140.
- Report number
- INIS-BR--934
Conference
- Title
- 10. Workshop on Nuclear Physics in Brazil.
- Dates
- 26-30 Aug 1987.
- Place
- Caxambu, MG (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 19019972
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, Numerical Data, No Abstract
- Descriptors DEI
- ALPHA DETECTION; CRYSTAL DOPING; ELECTROLYSIS; EXPERIMENTAL DATA; FILMS; INCIDENCE ANGLE; MEV RANGE 01-10; OXIDATION; RUTHERFORD SCATTERING; STOPPING POWER; SURFACE BARRIER DETECTORS; WIDTH; ZIRCONIUM OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLE DETECTION; CHEMICAL REACTIONS; DATA; DETECTION; DIMENSIONS; ELASTIC SCATTERING; ENERGY RANGE; INFORMATION; MEASURING INSTRUMENTS; MEV RANGE; NUMERICAL DATA; OXIDES; OXYGEN COMPOUNDS; RADIATION DETECTION; RADIATION DETECTORS; SCATTERING; SEMICONDUCTOR DETECTORS; TRANSITION ELEMENT COMPOUNDS; ZIRCONIUM COMPOUNDS
Optional Information
- Notes
- Imprint:Anais da 10. Reuniao de Trabalho sobre Fisica Nuclear no Brasil.