Grain growth and crack formation in NiO thin films by swift heavy ion irradiation
Creators
- 1. Department of Physics, Utkal University, Bhubaneswar 751 004 (India)
- 2. Department of Physics, North Orissa University, Baripada 757 003 (India)
- 3. School of Material Science and Technology, Institute of Technology, BHU, Varanasi 221 005 (India)
- 4. Inter-University Accelerator Center, Aruna Asaf Ali Marg, Post Box No: 10502, New Delhi 110 067 (India)
- 5. Institute of Physics, Bhubaneswar 751 005 (India)
Description
NiO thin films grown on Si(1 0 0) substrates by electron beam evaporation and sintered at 700 deg. C, were irradiated by 120 MeV Au9+ ions. Though irradiation is known to induce lattice disorder and suppression of crystallinity, we observe grain growth at some fluences of irradiation. Associated with the growth of grains, the films develop cracks at a fluence of 3 x 1012 ions cm-2. The width of the cracks increased at higher fluences. Swift heavy ion irradiation induced atomic diffusion and strain relaxation in nanoparticle thin films, which are not in thermodynamic equilibrium, seem to be responsible for the observed grain growth. This phenomenon along with the tensile stress induced surface instability lead to crack formation in the NiO thin films.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2009.11.004Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2009.11.004;
- PII
- S0168-583X(09)01282-8;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 268
- Journal Issue
- 5
- Journal Page Range
- p. 470-475
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41083276
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CRACK PROPAGATION; CRACKS; DIFFUSION; ELECTRON BEAMS; EVAPORATION; GRAIN GROWTH; HEAVY IONS; MEV RANGE; NANOSTRUCTURES; NICKEL OXIDES; SILICON; STRAINS; STRESS RELAXATION; STRESSES; THIN FILMS
- Descriptors DEC
- BEAMS; CHALCOGENIDES; CHARGED PARTICLES; ELEMENTS; ENERGY RANGE; FILMS; IONS; LEPTON BEAMS; MICROSCOPY; NICKEL COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; PHASE TRANSFORMATIONS; RELAXATION; SEMIMETALS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.