Published June 1991
| Version v1
Report
Generation and focusing of proton beam by the Inverse Pinch Ion Diode
- 1. Himeji Inst. of Tech., Hyogo (Japan)
Description
We performed generation and focusing of ion beams by the 'Inverse Pinch Ion Diode' which has a flat anode. The ion beams were extracted from a radial position of 10 ∼ 15 mm on the anode and the ion beams were focused on the diode axis at 120 mm from the anode. At this point, an ion current density of 0.4 kA/cm2 and a power density of 0.1 GW/cm2 were obtained. A focal angle was estimated to be 7deg. (author)
Additional details
Publishing Information
- Imprint Title
- Symposium on development and applications of intense pulsed particle beams
- Imprint Pagination
- 151 p.
- Journal Page Range
- p. 45-53.
- Report number
- NIFS-PROC--8
Conference
- Title
- Symposium on development and applications of intense pulsed particle beams.
- Dates
- 6-7 Dec 1990.
- Place
- Nagoya (Japan).
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 23029222
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM PRODUCTION; FOCUSING; HIGH-VOLTAGE PULSE GENERATORS; INERTIAL CONFINEMENT; ION BEAMS; ION SOURCES; PINCH EFFECT; PROTON BEAMS
- Descriptors DEC
- BEAMS; CONFINEMENT; ELECTRONIC EQUIPMENT; EQUIPMENT; FUNCTION GENERATORS; NUCLEON BEAMS; PARTICLE BEAMS; PLASMA CONFINEMENT; PULSE GENERATORS