Published December 30, 2016 | Version v1
Journal article Metadata-only

An Auger and XPS survey of cerium active corrosion protection for AA2024-T3 aluminum alloy

Creators

  • 1. IPREM-ECP-UMR CNRS 5254, Université de Pau et des Pays de l'Adour, Technopole Hélioparc, 2 Avenue Président Pierre Angot, 64053 Pau Cedex 09 (France)
  • 2. Université de Toulouse, UPS-INP-CNRS, Institut Carnot CIRIMAT, 118 Route de Narbonne, 31062 Toulouse Cedex 09 (France)
  • 3. Messier-Bugatti-Dowty, Etablissement de Molsheim, 3, rue Antoine de St Exupéry, 67129 Molsheim (France)

Description

Graphical abstract: Coupled SAM/SEM survey of cerium inhibitor migration towards corrosion pits in a conversion coating over AA2024-T3 substrate. - Highlights: • XPS evidenced the proximity of the inhibitor with the surface AA2024 alloy. • Cerium conversion coatings with [Ce] = 0.1 M offer the best corrosion resistance. • SAM shown the migration of Ce + III entities towards the corrosion pits or crevices. • High resolution analyses (Auger) connecting the nano-scale order with the chemical distribution.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2016.08.170

Additional details

Identifiers

DOI
10.1016/j.apsusc.2016.08.170;
PII
S0169-4332(16)31846-3;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
390
Journal Page Range
p. 751-759
ISSN
0169-4332
CODEN
ASUSEE

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48077518
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ALUMINIUM; ALUMINIUM ALLOYS; AUGER EFFECT; AUGER ELECTRON SPECTROSCOPY; CERIUM; COATINGS; CONVERSION; CORROSION; CORROSION PROTECTION; CORROSION RESISTANCE; MIGRATION; RESOLUTION; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SURFACES; X-RAY PHOTOELECTRON SPECTROSCOPY
Descriptors DEC
ALLOYS; CHEMICAL REACTIONS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; METALS; MICROSCOPY; PHOTOELECTRON SPECTROSCOPY; RARE EARTHS; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.