Published 1975 | Version v1
Report Open

Mechanism of enhancement of controllable secondary electron emission from fast single electrons

Description

The controllable secondary electron emission (CSEE) from single 0.7/2 MeV electrons was investigated for KCL porous films with the density approximately 2% of the normal density and the thicknesses from 50 to 400μm. The average emission coefficient sigma grew with E approximately 104/105 V/cm up to the value sigma approximately 230. The internal enhancement of CSEE in the film under the action of E field is explained by Townsend type discharge in gases. The possibility of the utilization of such films in particle detectors is discussed

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Additional details

Additional titles

Original title (Russian)
Механизм усиления управляемой вторичной электронной эмиссии от одиночных быстрых электронов

Publishing Information

Imprint Pagination
35 p.
Report number
EFI--131(75)

Optional Information

Notes
21 refs.; 14 figs.