Superficial characterization and nano structural of nano multilayers Cr/Cr N obtained by UBM with different unbalance grades
Creators
- 1. Universidad Nacional de Colombia, Departamento de Fisica, Carrera 45 No. 26-85, Edificio Uriel Gutierrez, Bogota D. C. (Colombia)
- 2. UNAM, Instituto de Fisica, Ciudad Universitaria, 04510 Mexico D. F. (Mexico)
- 3. Universidad Nacional de Colombia, Departamento de Ingenieria Mecanica y Mecatronica, Carrera 30 No. 45-03, Edificio 453, Bogota D. C. (Colombia)
Description
Coatings of 25 bilayers of Cr/Cr N, with total thickness between 1.32 and 1.67 microns, were deposited by reactive sputtering on silicon and H13 steel, in argon and argon with nitrogen atmospheres. A power of 160 watts, flows of argon and nitrogen of 9 and 3 sc cm respectively, and an axial unbalanced magnetron, whose coefficient of geometrical unbalance KG was varied between 0.85 and 1.37. Of these coatings, micrographs of surface and cross section scanning electron microscopy were obtained, was make a micro structural characterization with X-ray diffraction, a nano structural characterization by transmission electron microscopy, and surface characterization by atomic force microscopy in tapping mode: analysis showed uniform surface coating with globular and pyramidal formations, which contain some granular inclusions and microscopic craters. With the increase in the unbalance of the magnetic field, the grain size, the roughness and the speed of the coatings growth were increased. (Author)
Additional details
Additional titles
- Original title (Spanish)
- Caracterizacion superficial y nano estructural de nano multicapas Cr/CrN obtenidas por UBM con diferentes grados de desbalance
Publishing Information
- Journal Title
- Revista Mexicana de Fisica
- Journal Volume
- 59
- Journal Issue
- 1
- Journal Page Range
- p. 10-15
- ISSN
- 0035-001X
- CODEN
- RMXFAT
INIS
- Country of Publication
- Mexico
- Country of Input or Organization
- Mexico
- INIS RN
- 44115578
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ARGON; ATOMIC FORCE MICROSCOPY; COATINGS; CROSS SECTIONS; GRAIN SIZE; INCLUSIONS; LAYERS; MAGNETIC FIELDS; MAGNETRONS; NITROGEN; ROUGHNESS; SCANNING ELECTRON MICROSCOPY; SILICON; SPUTTERING; STEELS; SURFACE COATING; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; CARBON ADDITIONS; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; DIMENSIONS; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FLUIDS; GASES; IRON ALLOYS; IRON BASE ALLOYS; MICROSCOPY; MICROSTRUCTURE; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NONMETALS; RARE GASES; SCATTERING; SEMIMETALS; SIZE; SURFACE PROPERTIES; TRANSITION ELEMENT ALLOYS