Cross calibration of new x-ray films against direct exposure film from 1 to 8 keV using the X-pinch x-ray source
Creators
- 1. Laboratory of Laser Energetics, University of Rochester, Rochester, New York 14623 (United States)
- 2. Laboratory of Plasma Studies, Cornell University, Ithaca, New York 14853 (United States)
Description
A cross calibration of readily available x-ray sensitive films has been carried out against the calibrated direct exposure film (DEF) which is no longer being manufactured by Kodak. Four-wire X pinches made from various metal wires were used as x-ray sources for this purpose. Tests were carried out for the Kodak films Biomax MS, Biomax XAR, M100, Technical Pan, and T-Max over the energy range of 1-8 keV (12.4-1.5 A wavelength). The same hand-development procedures as described by Henke et al. [J. Opt. Soc. Am. B 3, 1540 (1986)] were followed for all films in every test. Sensitivity curves as a function of wavelength for these films relative DEF are presented. These relative calibrations show that Biomax MS is likely to be the best replacement film for DEF for most purposes over the energy range tested here
Additional details
Identifiers
- DOI
- 10.1063/1.2135276;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 76
- Journal Issue
- 11
- Journal Page Range
- p. 113111-113111.8
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37035739
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- CALIBRATION; FILMS; KEV RANGE; PLASMA; PLASMA DIAGNOSTICS; SENSITIVITY; WAVELENGTHS; WIRES; X RADIATION; X-RAY SOURCES
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ENERGY RANGE; IONIZING RADIATIONS; RADIATION SOURCES; RADIATIONS
Optional Information
- Notes
- (c) 2005 American Institute of Physics