Published November 2005 | Version v1
Journal article

Cross calibration of new x-ray films against direct exposure film from 1 to 8 keV using the X-pinch x-ray source

  • 1. Laboratory of Laser Energetics, University of Rochester, Rochester, New York 14623 (United States)
  • 2. Laboratory of Plasma Studies, Cornell University, Ithaca, New York 14853 (United States)

Description

A cross calibration of readily available x-ray sensitive films has been carried out against the calibrated direct exposure film (DEF) which is no longer being manufactured by Kodak. Four-wire X pinches made from various metal wires were used as x-ray sources for this purpose. Tests were carried out for the Kodak films Biomax MS, Biomax XAR, M100, Technical Pan, and T-Max over the energy range of 1-8 keV (12.4-1.5 A wavelength). The same hand-development procedures as described by Henke et al. [J. Opt. Soc. Am. B 3, 1540 (1986)] were followed for all films in every test. Sensitivity curves as a function of wavelength for these films relative DEF are presented. These relative calibrations show that Biomax MS is likely to be the best replacement film for DEF for most purposes over the energy range tested here

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
76
Journal Issue
11
Journal Page Range
p. 113111-113111.8
ISSN
0034-6748
CODEN
RSINAK

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37035739
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Descriptors DEI
CALIBRATION; FILMS; KEV RANGE; PLASMA; PLASMA DIAGNOSTICS; SENSITIVITY; WAVELENGTHS; WIRES; X RADIATION; X-RAY SOURCES
Descriptors DEC
ELECTROMAGNETIC RADIATION; ENERGY RANGE; IONIZING RADIATIONS; RADIATION SOURCES; RADIATIONS

Optional Information

Notes
(c) 2005 American Institute of Physics