Published June 1, 2007
| Version v1
Journal article
Morphology of amorphous Fe91Zr9/Al2O3 multilayers: Dewetting and crystallization
- 1. Department of Physics, Uppsala University, Box 530, SE-75121 Uppsala (Sweden)
- 2. Department of Engineering Sciences, Uppsala University, Box 534, SE-75121 Uppsala (Sweden)
Description
Amorphous Fe91Zr9/Al2O3 multilayers grown by magnetron sputtering have been studied using x-ray reflectometry, x-ray diffraction, Rutherford backscattering spectrometry, and transmission electron microscopy. It could be demonstrated that on the interface between the Fe91Zr9 and the Al2O3, crystalline grains are formed, that for very small repetition thicknesses destroy the periodicity of the multilayers by accumulative roughness. Understanding these effects would enable substantial improvement of the quality of nanolaminated amorphous layers
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter and Materials Physics
- Journal Volume
- 75
- Journal Issue
- 21
- Journal Page Range
- p. 214202-214202.6
- ISSN
- 1098-0121
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38101743
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM OXIDES; CRYSTALLIZATION; INTERFACES; IRON ALLOYS; LAYERS; MAGNETRONS; MORPHOLOGY; NANOSTRUCTURES; PERIODICITY; ROUGHNESS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPUTTERING; SURFACE COATING; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; ZIRCONIUM ALLOYS
- Descriptors DEC
- ALLOYS; ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; DIMENSIONS; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; SCATTERING; SPECTROSCOPY; SURFACE PROPERTIES; TRANSITION ELEMENT ALLOYS; VARIATIONS
Optional Information
- Notes
- (c) 2007 The American Physical Society