Published May 31, 1972 | Version v1
Patent Metadata-only

A device for the remote control and measurement of the strains of a sample test piece submitted to stresses in an aggressive medium

Creators

  • 1. Societe d'Etudes Technologiques Peeters, 92 - Chatenay-Malabry (France)
  • 2. CEA, 75 - Paris (France)

Description

no abstract available

Availability note (English)

Available from INPI, Paris.

Additional details

Additional titles

Original title (French)
Dispositif de controle et de mesure a distance des deformations sous contraintes d'une eprouvette-echantillon soumise a un milieu agressif
Augmented title (English)
creep measurements

Publishing Information

Imprint Pagination
14 p.
IPC:
Int. Cl. G01n3/00; G21c17/00.
IPC
Int. Cl. G01n3/00; G21c17/00.
Patent number
FR patent document 2187117/D/

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
6177659
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
CREEP; IRRADIATION CAPSULES; MEASURING METHODS; NEUTRONS; PHYSICAL RADIATION EFFECTS; SAMPLE PREPARATION; STRAINS
Descriptors DEC
BARYONS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; MECHANICAL PROPERTIES; NUCLEONS; RADIATION EFFECTS

Optional Information

Notes
Available from Institut National de la Propriete Industrielle, Paris (France).