Published November 20, 2006 | Version v1
Journal article

The Tevatron Ionization Profile Monitors

  • 1. Fermilab, Batavia, Illinois (United States)

Description

In designing an ionization profile monitor system for the Tevatron some novel approaches were taken, in particular for the readout electronics. This was motivated by the desire to resolve the individual bunches in both proton and pbar beams simultaneously. For this purpose, custom-made electronics originally developed for Particle Physics experiments was used to provide a fast charge integration with very low noise. The various parts of the readout electronics have been borrowed or adapted from the KTev, CMS, MINOS and BTev experiments. The detector itself also had to be modified to provide clean signals with sufficient bandwidth. The system design will be described along with the initial results

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
868
Journal Issue
1
Journal Page Range
p. 159-167
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
12. beam instrumentation workshop
Dates
1-4 May 2006
Place
Batavia, IL (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38058423
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANTIPROTON BEAMS; BEAM BUNCHING; FERMILAB TEVATRON; IONIZATION; PROTON BEAMS; READOUT SYSTEMS
Descriptors DEC
ACCELERATORS; ANTINUCLEON BEAMS; ANTIPARTICLE BEAMS; BEAM DYNAMICS; BEAMS; CYCLIC ACCELERATORS; DYNAMICS; MECHANICS; NUCLEON BEAMS; PARTICLE BEAMS; SYNCHROTRONS

Optional Information

Notes
(c) 2006 American Institute of Physics