Published November 20, 2006
| Version v1
Journal article
The Tevatron Ionization Profile Monitors
Creators
- 1. Fermilab, Batavia, Illinois (United States)
Description
In designing an ionization profile monitor system for the Tevatron some novel approaches were taken, in particular for the readout electronics. This was motivated by the desire to resolve the individual bunches in both proton and pbar beams simultaneously. For this purpose, custom-made electronics originally developed for Particle Physics experiments was used to provide a fast charge integration with very low noise. The various parts of the readout electronics have been borrowed or adapted from the KTev, CMS, MINOS and BTev experiments. The detector itself also had to be modified to provide clean signals with sufficient bandwidth. The system design will be described along with the initial results
Additional details
Identifiers
- DOI
- 10.1063/1.2401401;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 868
- Journal Issue
- 1
- Journal Page Range
- p. 159-167
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 12. beam instrumentation workshop
- Dates
- 1-4 May 2006
- Place
- Batavia, IL (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38058423
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANTIPROTON BEAMS; BEAM BUNCHING; FERMILAB TEVATRON; IONIZATION; PROTON BEAMS; READOUT SYSTEMS
- Descriptors DEC
- ACCELERATORS; ANTINUCLEON BEAMS; ANTIPARTICLE BEAMS; BEAM DYNAMICS; BEAMS; CYCLIC ACCELERATORS; DYNAMICS; MECHANICS; NUCLEON BEAMS; PARTICLE BEAMS; SYNCHROTRONS
Optional Information
- Notes
- (c) 2006 American Institute of Physics