Annular gas ionization detector for low energy heavy ion backscattering spectrometry
Creators
- 1. Ion Beam Physics, ETH Zurich and Paul Scherrer Institute, IPP HPK H32, Schafmattstrasse 20, CH-8093 Zurich (Switzerland)
Description
A gas ionization chamber for use in backscattering spectrometry has been built. It has the shape of a hollow cylinder and can be placed in-line with the incident ion beam. The entrance window for detected particles is composed of a circular array of silicon nitride membranes. A low noise preamplifier with cooled FET is used for charge amplification. The detector resolution has been measured for a variety of ions in the mass range from He to Si and for energies between 0.5 and 8 MeV. The energy resolution of the ionization chamber surpasses the one of a state-of-the-art silicon charged particle detector for all ions heavier than Li. For Si ions the improvement in resolution is more than a factor of 2. The device does not suffer from any radiation damage. For He particles around 1 MeV the resolution is between 13 and 16 keV (FWHM). Therefore the new detector is not only well suited for heavy ion backscattering spectrometry but can also be applied for standard He RBS, allowing the use of a single detector for all types of projectiles in a wide energy range.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2009.01.031Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2009.01.031;
- PII
- S0168-583X(09)00180-3;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 267
- Journal Issue
- 7
- Journal Page Range
- p. 1193-1198
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41027692
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BACKSCATTERING; ENERGY RESOLUTION; HEAVY IONS; ION BEAMS; IONIZATION; IONIZATION CHAMBERS; KEV RANGE 01-10; MEV RANGE 01-10; RADIATION EFFECTS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON IONS; SILICON NITRIDES
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ENERGY RANGE; IONS; KEV RANGE; MEASURING INSTRUMENTS; MEV RANGE; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; RADIATION DETECTORS; RESOLUTION; SCATTERING; SILICON COMPOUNDS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.