Published April 15, 2009 | Version v1
Journal article

Annular gas ionization detector for low energy heavy ion backscattering spectrometry

  • 1. Ion Beam Physics, ETH Zurich and Paul Scherrer Institute, IPP HPK H32, Schafmattstrasse 20, CH-8093 Zurich (Switzerland)

Description

A gas ionization chamber for use in backscattering spectrometry has been built. It has the shape of a hollow cylinder and can be placed in-line with the incident ion beam. The entrance window for detected particles is composed of a circular array of silicon nitride membranes. A low noise preamplifier with cooled FET is used for charge amplification. The detector resolution has been measured for a variety of ions in the mass range from He to Si and for energies between 0.5 and 8 MeV. The energy resolution of the ionization chamber surpasses the one of a state-of-the-art silicon charged particle detector for all ions heavier than Li. For Si ions the improvement in resolution is more than a factor of 2. The device does not suffer from any radiation damage. For He particles around 1 MeV the resolution is between 13 and 16 keV (FWHM). Therefore the new detector is not only well suited for heavy ion backscattering spectrometry but can also be applied for standard He RBS, allowing the use of a single detector for all types of projectiles in a wide energy range.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2009.01.031

Additional details

Identifiers

DOI
10.1016/j.nimb.2009.01.031;
PII
S0168-583X(09)00180-3;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
267
Journal Issue
7
Journal Page Range
p. 1193-1198
ISSN
0168-583X
CODEN
NIMBEU

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.