Published 2017 | Version v1
Journal article Metadata-only

Analysis of Multilayer Devices for Superconducting Electronics by High-Resolution Scanning Transmission Electron Microscopy and Energy Dispersive Spectroscopy

Creators

  • 1. Sandia National Laboratory (SNL-NM), Albuquerque, NM (United States)
  • 2. New York University, NY (United States)

Description

We used a focused ion beam to obtain cross-sectional specimens from both magnetic multilayer and Nb/Al-AlOx/Nb Josephson junction devices for characterization by scanning transmission electron microscopy (STEM) and energy dispersive X-ray spectroscopy (EDX). An automated multivariate statistical analysis of the EDX spectral images produced chemically unique component images of individual layers within the multilayer structures. STEM imaging elucidated distinct variations in film morphology, interface quality, and/or etch artifacts that could be correlated to magnetic and/or electrical properties measured on the same devices.

Availability note (English)

Available from http://www.osti.gov/pages/biblio/1356860; DOE Accepted Manuscript full text, or the publishers Best Available Version will be available free of charge after the embargo period

Additional details

Identifiers

URL
http://www.osti.gov/pages/biblio/1356860;
DOI
10.1109/tasc.2017.2669579;

Publishing Information

Journal Title
IEEE Transactions on Applied Superconductivity (Print)
Journal Volume
27
Journal Issue
4
Journal Page Range
4 p.
ISSN
1051-8223

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
48090746
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ALUMINIUM; ALUMINIUM OXIDES; ELECTRICAL PROPERTIES; INTERFACES; ION BEAMS; JOSEPHSON JUNCTIONS; LAYERS; MAGNETIC MATERIALS; MAGNETIC PROPERTIES; MULTIVARIATE ANALYSIS; NIOBIUM; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY SPECTROSCOPY
Descriptors DEC
ALUMINIUM COMPOUNDS; BEAMS; CHALCOGENIDES; ELECTRON MICROSCOPY; ELEMENTS; FILMS; MATERIALS; MATHEMATICS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; REFRACTORY METALS; SPECTROSCOPY; STATISTICS; SUPERCONDUCTING JUNCTIONS; TRANSITION ELEMENTS; TUNNEL JUNCTIONS

Optional Information

Contract/Grant/Project number
AC04-94AL85000
Funding organization
USDOE (United States); Intelligence Advanced Research Projects Activity (IARPA) (United States)
Secondary number(s)
SAND--2017-4569J; OSTIID--1356860