Elemental analysis by X fluorescence. Analysis and Control Master

This course presents X rays with their definition, history and noticed characteristics at their discovery, production with X-ray tubes (emitted spectrum, spectrum characteristics), with radioactive sources or with a synchrotron radiation, the X-ray absorption phenomenon (mechanism, absorption law, variation of absorption with respect to wavelength, application with realisation of filters), X-ray diffraction analysis (description of a single crystal, X ray diffraction). The second part presents the principle of X fluorescence: excitation of X rays characteristics of sample elements, fluorescence efficiency, satellite lines, analysis of emitted radiations (diffractive analysis, energy dispersive X spectrometry). The third part presents the X fluorescence spectrometer with analyser single-crystal: components (x ray source, sample, dispersive system, detector), qualitative analysis, quantitative analysis (problem, external direct calibration, self-calibration, internal standard, routine control). The energy-dispersive X fluorescence spectrometer is then presented: semiconductor junction, multi-canal analyser. The both apparatus configurations are briefly compared, and portable spectrometers are evoked in terms of performance. Analytic characteristics of X fluorescence, and fields of application are briefly indicated