Published 2005
| Version v1
Book
Numerical simulation of longitudinal discharges in capillary sources of electromagnetic radiation
Creators
- 1. D.V. Efremov Scientific Research Inst. of Electrophysical Apparatus, St. Petersburg (Russian Federation)
Description
The report presents the results of numerical analysis of fast capillary discharges which are of interest in creating radiation sources of EUV spectral range. The methods are analyzed for correlation of the plasma dynamics and radiation with operating conditions of the discharge
Abstract (Russian)
Представлены результаты численного моделирования быстрых капиллярных разрядов, представляющих интерес с точки зрения создания источников крайнего ультрафиолетового излучения. Анализируются методы корреляции динамики плазмы и излучения с условиями разрядаAdditional details
Publishing Information
- Publisher
- D.V. Efremov Scientific Research Inst. of Electrophysical Apparatus
- Imprint Place
- Saint-Petersburg (Russian Federation)
- ISBN
- 5-87911-088-5
- Imprint Title
- 15th International conference on high-power particle beams. BEAMS'2004. Proceedings
- Imprint Pagination
- 922 p.
- Journal Page Range
- p. 491-494
Conference
- Title
- 15. International conference on high-power particle beams. BEAMS'2004
- Dates
- 18-23 Jul 2004
- Place
- Saint-Petersburg (Russian Federation)
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 37073383
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON; CAPILLARY FLOW; COMPUTERIZED SIMULATION; CORRELATIONS; ELECTRIC DISCHARGES; ELECTRON TEMPERATURE; EXTREME ULTRAVIOLET RADIATION; ION TEMPERATURE; LONGITUDINAL PINCH; MATHEMATICAL MODELS; PARAMETRIC ANALYSIS; PLASMA DENSITY; RADIATION SOURCES; TIME DEPENDENCE
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELEMENTS; FLUID FLOW; FLUIDS; GASES; NONMETALS; PINCH EFFECT; RADIATIONS; RARE GASES; SIMULATION; ULTRAVIOLET RADIATION
Optional Information
- Notes
- 14 refs., 1 fig.