Published July 1991 | Version v1
Journal article Metadata-only

Radiation damage of silicon detectors by monoenergetic neutrons and electrons

Creators

  • 1. Hamburg Univ. (Germany, F.R.)
  • 2. Tel Aviv Univ. (Israel)
  • 3. PTB, Braunschweig (Germany, F.R.)

Description

The effects of radiation damage produced by monoenergetic neutrons and electrons in silicon detectors are studied. With respect to the detector performance detailed measurements of the leakage current increase, charge collection deficiency and change of the effective donor concentration are investigated as function of energy and particle fluence. A first set of results obtained by using the method of deep level transient spectroscopy leads to preliminary conclusions for the observed radiation induced point defects. (orig.)

Additional details

Publishing Information

Journal Title
Nuclear Physics. B, Proceedings Supplements
Journal Volume
23A
Series
Nucl. Phys., B Proc. Suppl.
Journal Page Range
324-332
ISSN
0920-5632
CODEN
NPBSE

Conference

Title
2. international conference on advanced technology and particle physics.
Dates
11-15 Jun 1990.
Place
Como (Italy).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
23002536
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANNEALING; CHARGE COLLECTION; ELECTRON BEAMS; ENERGY DEPENDENCE; IMPURITIES; LEAKAGE CURRENT; MEV RANGE 01-10; MEV RANGE 10-100; NEUTRON BEAMS; NEUTRON FLUENCE; PHYSICAL RADIATION EFFECTS; POINT DEFECTS; PROTON BEAMS; SI SEMICONDUCTOR DETECTORS; SILICON; TRAPPING
Descriptors DEC
BEAMS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CURRENTS; ELECTRIC CURRENTS; ELEMENTS; ENERGY RANGE; HEAT TREATMENTS; LEPTON BEAMS; MEASURING INSTRUMENTS; MEV RANGE; NUCLEON BEAMS; PARTICLE BEAMS; RADIATION DETECTORS; RADIATION EFFECTS; SEMICONDUCTOR DETECTORS; SEMIMETALS

Optional Information

Contract/Grant/Project number
Contract BMFT 055HH19I