Method for optimizing side shielding in positron-emission tomographs and for comparing detector materials
Description
This report presents analytical formulas for the image-forming and background event rates seen by circular positron-emission tomographs with parallel side shielding. These formulas include deadtime losses, detector efficiency, coincidence resolving time, amount of activity, patient port diameter, shielding gap, and shielding depth. A figure of merit, defined in terms of these quantities, describes the signal-to-noise ratio in the reconstructed image of a 20-cm cylinder of water with uniformly dispersed activity. Results are presented for the scintillators NaI(TI), bismuth germanate (BGO), CsF, and plastic; and for Ge(Li) and wire chambers with converters. In these examples, BGO provided the best signal-to-noise for activity levels below 1000 μCi per cm, and CsF had the advantage for higher activity levels
Additional details
Publishing Information
- Journal Title
- J. Nucl. Med.
- Journal Volume
- 21
- Journal Issue
- 10
- Series
- J. Nucl. Med.
- Journal Page Range
- 971-977
- ISSN
- 0022-3123
Conference
- Title
- 28. annual meeting of the Society of Nuclear Medicine.
- Dates
- 16 Jun 1981.
- Place
- Las Vegas, NV, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 12592781
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S62: RADIOLOGY AND NUCLEAR MEDICINE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BISMUTH; CESIUM FLUORIDES; COINCIDENCE METHODS; COMPARATIVE EVALUATIONS; GE SEMICONDUCTOR DETECTORS; GERMANATES; NAI DETECTORS; NOISE; OPTIMIZATION; PLASTIC SCINTILLATION DETECTOR; POSITRON COMPUTED TOMOGRAPHY; SHIELDING
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CESIUM COMPOUNDS; COMPUTERIZED TOMOGRAPHY; COUNTING TECHNIQUES; DIAGNOSTIC TECHNIQUES; ELEMENTS; EMISSION COMPUTED TOMOGRAPHY; FLUORIDES; FLUORINE COMPOUNDS; GERMANIUM COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; MEASURING INSTRUMENTS; METALS; OXYGEN COMPOUNDS; RADIATION DETECTORS; SCINTILLATION COUNTERS; SEMICONDUCTOR DETECTORS; SOLID SCINTILLATION DETECTORS; TOMOGRAPHY