Published 1985 | Version v1
Miscellaneous Metadata-only

The analysis of minor elements by thin-film x-ray fluorescence spectrometry

Creators

  • 1. Council for Mineral Technology, Randburg (South Africa). Analytical Chemistry Div.

Description

Over the past ten to twenty years, thin-film x-ray fluorescence spectrometry has become an established method of analysis. It's use in the metallurgical industry has been limited. An increasing number of applications are being found for this approach at Mintek in the analysis of a wide variety of samples generated by metal- and mineral processing operations. The determination of some elements by this method is briefly discussed in this extended abstract

Additional details

Publishing Information

Imprint Place
Pretoria (South Africa)
ISBN
0 7988 2371 2
Imprint Title
Second international symposium on analytical chemistry in the exploration, mining and processing of materials
Imprint Pagination
348 p.
Journal Page Range
p. 332-333.

Conference

Title
2. International symposium on analytical chemistry in the exploration, mining and processing of materials.
Dates
15-19 Apr 1985.
Place
Pretoria (South Africa).

INIS

Country of Publication
South Africa
Country of Input or Organization
South Africa
INIS RN
20001624
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
ACCURACY; EXTRACTIVE METALLURGY; FILTERS; MATRICES; MOLYBDENUM; PLATINUM METALS; SAMPLE PREPARATION; SPECTROSCOPY; THIN FILMS; TUNGSTEN; X-RAY FLUORESCENCE ANALYSIS; ZIRCONIUM
Descriptors DEC
CHEMICAL ANALYSIS; ELEMENTS; FILMS; METALLURGY; METALS; NONDESTRUCTIVE ANALYSIS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS

Optional Information

Notes
An extended abstract with references.