Published March 10, 2009 | Version v1
Journal article

Elemental Discrimination of Low-Energy Ions using Risetime Analysis of Silicon-Strip Detector Signals

  • 1. Physics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 (United States)
  • 2. Dept. of Physics and Astronomy, University of Tennessee, Knoxville, TN 37996 (United States)

Description

To make measurements with the intense (but often contaminated) radioactive beams available today, one often needs to identify the reaction products to determine the events of interest. The low energies required for many astrophysics measurements make impossible the use of traditional energy loss techniques, and additional constraints are required. We demonstrate a simple technique to measure the risetimes of silicon strip-detector signals and show partial discrimination can be obtained even at energies below 1 MeV/u.

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1099
Journal Issue
1
Journal Page Range
p. 829-831
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
12. international conference on application of accelerators in research and industry
Acronym
CAARI 2008
Dates
10-15 Aug 2008
Place
Fort Worth, TX (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41037029
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGED PARTICLE DETECTION; ENERGY LOSSES; MEV RANGE; PULSE DISCRIMINATORS; RADIOACTIVE ION BEAMS; SI MICROSTRIP DETECTORS
Descriptors DEC
BEAMS; DETECTION; DISCRIMINATORS; ELECTRONIC CIRCUITS; ENERGY RANGE; ION BEAMS; LOSSES; MEASURING INSTRUMENTS; PULSE CIRCUITS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS

Optional Information

Notes
(c) 2009 American Institute of Physics