Published March 10, 2009
| Version v1
Journal article
Elemental Discrimination of Low-Energy Ions using Risetime Analysis of Silicon-Strip Detector Signals
- 1. Physics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 (United States)
- 2. Dept. of Physics and Astronomy, University of Tennessee, Knoxville, TN 37996 (United States)
Description
To make measurements with the intense (but often contaminated) radioactive beams available today, one often needs to identify the reaction products to determine the events of interest. The low energies required for many astrophysics measurements make impossible the use of traditional energy loss techniques, and additional constraints are required. We demonstrate a simple technique to measure the risetimes of silicon strip-detector signals and show partial discrimination can be obtained even at energies below 1 MeV/u.
Additional details
Identifiers
- DOI
- 10.1063/1.3120167;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1099
- Journal Issue
- 1
- Journal Page Range
- p. 829-831
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 12. international conference on application of accelerators in research and industry
- Acronym
- CAARI 2008
- Dates
- 10-15 Aug 2008
- Place
- Fort Worth, TX (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41037029
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGED PARTICLE DETECTION; ENERGY LOSSES; MEV RANGE; PULSE DISCRIMINATORS; RADIOACTIVE ION BEAMS; SI MICROSTRIP DETECTORS
- Descriptors DEC
- BEAMS; DETECTION; DISCRIMINATORS; ELECTRONIC CIRCUITS; ENERGY RANGE; ION BEAMS; LOSSES; MEASURING INSTRUMENTS; PULSE CIRCUITS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS
Optional Information
- Notes
- (c) 2009 American Institute of Physics