X-ray fluorescence spectroscopy of Te, Sb, Bi in combination with Rb, Sr, U, Th and Pb in rock and ore samples

Technique for Te, Sb, Bi analysis in a combination with Rb, Sr, U, Th and Pb in rock and ore samples is described. ARE-6 x-ray device was used. Element contents were analysed with provision for chemical sample composition according to x-ray tube Mo-anode radiation incoherently scattered on it. To improve analysis accuracy, especially at element contents <0.01%, mutual impositions of characteristic element radiation were taken account of, and to determine the background under the element line peak more precisely, measurements of two background positions selected in spectrum were used. The Te, Sb and Bi analysis technique permits to improve accuracy 2-3 times. The limiting sensitivity was (%): Sr, Rb∼2x10-5; U, Bi, Th, Pb ∼ 5x10-5; Te and Sb(1.5±0.5)x10-4. Analysis time of one sample is one hour