Published 1977 | Version v1
Journal article

Component reliability exposed to thermal neutron environment

  • 1. M.M. Modi College, Modinagar (U.P.) (India)

Description

This paper deals with the evaluation of the reliability of a component exposed to nuclear radiation stress consisting of incident particles, possessing either a unique energy value or following an energy distribution. These incident particles transfer energy to the targets when they impinge on them. A general expression has been obtained for the 'effective nuclear radiation stress' which determines an interaction of the incident particles with the target nuclei. It has been assumed that the activated nuclei produced in the (n, γ) radiative capture process, are transformed into impurity atoms in the component material through β--decay. These impurity atoms are responsible for the unwanted behaviour of the component. In this part, survival probability of a component has been evaluated when it is exposed to thermal neutron flux for two cases, viz, for a time less than the exposure time and also for the time more than the exposure time. The model has also been illustrated numerically and graphically. (author)

Additional details

Additional titles

Subtitle (English)

Identifiers

Publishing Information

Journal Title
Microelectronics Reliability
Journal Volume
16
Journal Issue
2
Series
Microelectron. Reliab.
Journal Page Range
149-153
ISSN
0026-2714

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
8333112
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ENVIRONMENT; MATHEMATICAL MODELS; RADIATION EFFECTS; REACTOR COMPONENTS; RELIABILITY; STRESSES; THERMAL NEUTRONS
Descriptors DEC
BARYONS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; NEUTRONS; NUCLEONS

Optional Information

Notes
Updated automatically by Metadata and Full-Text Enrichment Agent