High-performance diamond radiation detectors produced by lift-off method
Creators
- 1. Graduate School of Engineering, Hokkaido University - Kita 13, Nishi 8, Kita-ku, Sapporo 060-8628 (Japan)
- 2. Research Institute for Electronics and Photonics, National Institute of Advanced Industrial Science and Technology 1-1-1 Higashi, Tsukuba 305-8562, Ibaraki (Japan)
- 3. Diamond Research Laboratory, National Institute of Advanced Industrial Science and Technology (AIST) 1-8-31 Midorigaoka, Ikeda, Osaka 563-8577 (Japan)
Description
For stable semiconductor detector operation under harsh environments, an ideal single-crystal diamond without a charge trapping centre is required. For this study, a self-standing single-crystal CVD diamond was fabricated using a lift-off method. The reduction of charge trapping factors such as structural defects, point defects, and nitrogen impurities, was attempted using 0.2% of low-methane concentration growth and using a full metal seal chamber. A high-quality self-standing diamond with strong free-exciton recombination emission was obtained. Charge collection efficiencies were 100.1% for holes and 99.8% for electrons, provided that and . Energy resolutions were 0.38% for both holes and electrons. We produced a high-performance diamond radiation detector using the productive lift-off method. (letter)
Availability note (English)
Available from http://dx.doi.org/10.1209/0295-5075/113/62001Additional details
Identifiers
Publishing Information
- Journal Title
- Europhysics Letters
- Journal Volume
- 113
- Journal Issue
- 6
- Journal Page Range
- [6 p.]
- ISSN
- 0295-5075
- CODEN
- EULEEJ
INIS
- Country of Publication
- France
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51026524
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CHEMICAL VAPOR DEPOSITION; DIAMONDS; HOLES; METALS; MONOCRYSTALS; POINT DEFECTS; SEMICONDUCTOR DETECTORS; TRAPPING
- Descriptors DEC
- CARBON; CHEMICAL COATING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DEPOSITION; ELEMENTS; MEASURING INSTRUMENTS; MINERALS; NONMETALS; RADIATION DETECTORS; SURFACE COATING