Quality control of analogue to digital conversion circuitry for artefact-free SPECT imaging

A simple method for the objective, quantitative assessment of analogue to digital conversion (ADC) differential linearity has been developed for SPECT imaging. The analytical approach uses the fact that a differential non-linearity in the ADC will produce a non-uniformity in the digitized image which has a well defined periodicity. This can be most clearly demonstrated in the frequency space domain by determining the Fourier transform of a thick profile which is taken through the centre of a flood field image. The accuracy of the method permits deteriorations in the performance of ADCs to be detected well before significant reductions in SPECT image quality are produced. The availability of a quantitative measure of ADC performance, which can be tested objectively using a simple data acquisition method, is of value in the specification, acceptance testing and general quality control of gamma camera SPECT systems. (author)