Published April 1998 | Version v1
Journal article

Thickness monitoring based compton back-scattering by single point testing

  • 1. Doctor A.Q. Khan Research Labs., Rawalpindi (Pakistan). Process Technology Div
  • 2. Brunel Univ., Uxbridge (United Kingdom). Dept. of Physics

Description

The use of Compton backscattering for the rapid on-line monitoring of steel thickness when access is available only from one side of the sample, has been investigated. So the thickness measurements of steel sections have been evaluated, based on Compton backscattering by using single point testing technique at various distances. It was found that with the set up (5 Ci /sup 60/Co, 135 deg. backscatter), by getting the energy spectrum of the backscattered gamma rays measuring intensities over a restricted energy range, steel sections up to 25 mm thickness could be measured. Therefore, a compton backscattering thickness gauge enables steel selections to be measured with a precision of better than 1 mm. (author)

Additional details

Publishing Information

Journal Title
Science International (Lahore)
Journal Volume
10
Journal Issue
2
Journal Page Range
p. 95-100
ISSN
1013-5316