Published February 22, 2006
| Version v1
Journal article
Delocalisation in images of Pt nanoparticles
- 1. Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ (United Kingdom)
- 2. Centre d'Etudes de Chimie Metallurgique, Centre National de Recherche Scientifique, 15 rue G. Urbain, 94407 Vitry-sur-Seine (France)
- 3. Johnson Matthey Technology Centre, Blount's Court, Sonning Common, Reading RG4 9NH (United Kingdom)
Description
Delocalisation is an imaging artefact that results in the presence of lattice fringes outside a crystal imaged in a transmission electron microscope (TEM) in the presence of spherical aberration and/ or defocus. Here, we show that delocalisation can be used to determine the absolute defocus values of chosen features in a specimen from a defocus series of images, what may be used to improve computer reconstruction methods. These values are important for optimising the accuracy of information about the specimen obtained using techniques such as exit wavefunction restoration
Availability note (English)
Available online at http://stacks.iop.org/1742-6596/26/292/jpconf6_26_070.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 26
- Journal Issue
- 1
- Journal Page Range
- p. 292-295
- ISSN
- 1742-6596
Conference
- Title
- Conference on imaging, analysis and fabrication on the nanoscale
- Acronym
- EMAG-NANO 2005
- Dates
- 31 Aug - 2 Sep 2005
- Place
- Leeds (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37056108
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; CRYSTALS; GEOMETRICAL ABERRATIONS; IMAGES; NANOSTRUCTURES; PARTICLES; PLATINUM; TRANSMISSION ELECTRON MICROSCOPY; WAVE FUNCTIONS
- Descriptors DEC
- ELECTRON MICROSCOPY; ELEMENTS; FUNCTIONS; METALS; MICROSCOPY; PLATINUM METALS; TRANSITION ELEMENTS