Microfabrication on Teflon surface by MeV-proton-microbeam and keV-nitrogen-ion-beam irradiation
- 1. Department of Advanced Radiation Technology, Takasaki Advanced Radiation Research Institute, Japan Atomic Energy Agency, 1233 Watanuki-machi, Takasaki, Gunma 370-1292 (Japan)
- 2. Advanced Science Institute, RIKEN, 2-1 Hirosawa, Wako-shi, Saitama 350-0198 (Japan)
Description
Polytetrafluoroethylene (PTFE) and fluorinated ethylene propylene (FEP) are fluoropolymers that have several desirable technological properties, such as electrical insulation and chemical inertness. Nitrogen ion beam irradiation at high fluence forms dense microprotrusions on PTFE and FEP surfaces. Such unique surface structures are useful in cell culture dishes where cells can attach and spread on top of the protrusions. To enhance this functionality, control of surface morphology is necessary. In this study, we create smooth patterns between micro-protrusions by using focused MeV proton beam scanning and subsequent keV nitrogen ion beam irradiation. As a result, many double bonds (C=C) and oxygen-containing groups were detected by attenuated total reflectance/Fourier infrared spectroscopy, particularly in the smooth areas
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2013.01.017Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2013.01.017;
- PII
- S0168-583X(13)00118-3;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 307
- Journal Page Range
- p. 610-613
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 18. international conference on ion beam modifications of materials
- Acronym
- IBMM2012
- Dates
- 2-7 Sep 2012
- Place
- Qingdao (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45065347
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; CELL CULTURES; DOUBLE BONDS; ELECTRICAL INSULATION; ETHYLENE; INFRARED SPECTRA; ION BEAMS; IRRADIATION; KEV RANGE; MEV RANGE; MORPHOLOGY; NITROGEN IONS; OXYGEN; PROPYLENE; PROTON BEAMS; PROTONS; SURFACES; TEFLON
- Descriptors DEC
- ALKENES; BARYONS; BEAMS; CHARGED PARTICLES; CHEMICAL BONDS; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; FERMIONS; FLUORINATED ALIPHATIC HYDROCARBONS; HADRONS; HALOGENATED ALIPHATIC HYDROCARBONS; HYDROCARBONS; IONS; MATERIALS; NONMETALS; NUCLEON BEAMS; NUCLEONS; ORGANIC COMPOUNDS; ORGANIC FLUORINE COMPOUNDS; ORGANIC HALOGEN COMPOUNDS; ORGANIC POLYMERS; PARTICLE BEAMS; PETROCHEMICALS; PETROLEUM PRODUCTS; PLASTICS; POLYETHYLENES; POLYMERS; POLYOLEFINS; POLYTETRAFLUOROETHYLENE; SPECTRA; SPECTROSCOPY; SYNTHETIC MATERIALS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.