Published 2007 | Version v1
Miscellaneous Metadata-only

Study of nanodimensional defects of perfect crystals, films and multilayer nanostructures by means of X-ray small angle scattering

Creators

  • 1. Fiziko-Tekhnicheskij Inst. im. A.F. Ioffe RAN, Sankt-Peterburg (Russian Federation)

Description

no abstract available

Part of:
The VI National conference on application of X-ray, synchrotron radiations, neutrons and electrons for material investigation (RSNEh 2007). The continuation of All-Union conferences on X-ray application for material investigation. Book of abstracts

Additional details

Additional titles

Original title (Russian)
Исследование наноразмерных дефектов совершенных кристаллов, пленок и многослойных наносистем методом малоуглового рассеяния рентгеновских лучей

Publishing Information

Publisher
IK RAN
Imprint Place
Moscow (Russian Federation)
Imprint Title
The VI National conference on application of X-ray, synchrotron radiations, neutrons and electrons for material investigation (RSNEh 2007). The continuation of All-Union conferences on X-ray application for material investigation. Book of abstracts
Imprint Pagination
650 p.
Journal Page Range
p. 243
Report number
INIS-RU--507

Conference

Title
6. National conference on application of X-ray, synchrotron radiations, neutrons and electrons for material investigation (RSNEh 2007)
Original Conference Title
VI Natsional'naya konferentsiya po primeneniyu rentgenovskogo, sinkhrotronnogo izluchenij, nejtronov i ehlektronov dlya issledovaniya materialov (RSNEh 2007)
Dates
12-17 Nov 2007
Place
Moscow (Russian Federation)

INIS

Country of Publication
Russian Federation
Country of Input or Organization
Russian Federation
INIS RN
39072828
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
No Abstract, Conference, Non-conventional Literature
Descriptors DEI
CRYSTAL STRUCTURE; DOMAIN STRUCTURE; GALLIUM ANTIMONIDES; GALLIUM ARSENIDES; NANOSTRUCTURES; PORE STRUCTURE; SILICON CARBIDES; SMALL ANGLE SCATTERING; SOLID SOLUTIONS; X-RAY DIFFRACTION
Descriptors DEC
ANTIMONIDES; ANTIMONY COMPOUNDS; ARSENIC COMPOUNDS; ARSENIDES; CARBIDES; CARBON COMPOUNDS; COHERENT SCATTERING; DIFFRACTION; DISPERSIONS; GALLIUM COMPOUNDS; HOMOGENEOUS MIXTURES; MICROSTRUCTURE; MIXTURES; PNICTIDES; SCATTERING; SILICON COMPOUNDS; SOLUTIONS

Optional Information

Notes
Imprint:VI Natsional'naya konferentsiya po primeneniyu rentgenovskogo, sinkhrotronnogo izluchenij, nejtronov i ehlektronov dlya issledovaniya materialov (RSNEh 2007). Prodolzhenie Vsesoyuznykh soveshchanij po primeneniyu rentgenovskikh luchej dlya issledovaniya materialov. Tezisy dokladov