A new method for the interpretation of energy distributions measured on secondary ions

Experiments are described in which the energy distributions of positive and negative secondary ions are measured for four elements (Si, Fe, Cu, Ta) under Cs+ and Xe+ bombardment. It is shown that the energy dependence of the ratio of two corresponding energy distributions, calculated point by point is in very good agreement with the potential law of energy. With the help of these results the surface ionization model of Sroubek is examined. (author)