Published December 2011 | Version v1
Journal article

Research on the electrical characteristics of an organic thin-film field-effect transistor based on alternating-current resistance

  • 1. Institute of Optoelectronics Technology, Beijing Jiaotong University, Beijing 100044 (China)
  • 2. Physics Department, Liaoning University, Shenyang 110036 (China)

Description

In this article, an organic thin-film field-effect transistor (OTFFET) with top-gate and bottom-contact geometry based on pentacene as the active layer is fabricated. The experimental data of the I—V are obtained from the OTFFET device. The alternating-current (AC) resistance value of the OTFFET device is calculated using the derivation method from the experimental data, and the AC resistance trend curves of the OTFFET device are obtained with the region fitting method. We analyse the characteristics of the OTFFET device with an AC resistance trend curve. To discover whether it has a high resistance, it is proposed to judge the region of the source/drain voltage (VDS) less than the transition voltage, thereby determining whether the contact between the metal electrode and the organic semiconductor layer of the OTFFET device is Ohmic or non-Ohmic. The theoretical analysis shows that the field-effect mobility and the AC resistance are in reverse proportion. Therefore, we point out that reducing AC resistance is necessary if field-effect mobility is to be improved. (condensed matter: electronic structure, electrical, magnetic, and optical properties)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-1056/20/12/127303

Additional details

Publishing Information

Journal Title
Chinese Physics. B
Journal Volume
20
Journal Issue
12
Journal Page Range
[4 p.]
ISSN
1674-1056