Published April 1992
| Version v1
Journal article
Image processing for crystal structure determination by high resolution electron microscopy imaging
Description
A new approach to crystal structure determination based on a single high resolution electron microscope image and the corresponding electron diffraction pattern is introduced. This is, in fact, a kind of image processing by means of an electron diffraction analysis technique and contains two steps: image deconvolution and resolution enhancement. In the first step the image, taken under arbitrary de-focussed conditions, is transformed into the structure image; in the second step the image resolution is enhanced by a phase extension technique. The resolution of the final structure image exceeds the resolution limit of the electron microscopy
Additional details
Publishing Information
- Journal Title
- Wuli
- Journal Volume
- 21
- Journal Issue
- 4
- Journal Page Range
- p. 202-207.
- ISSN
- 0379-4148
- CODEN
- WULIAL
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 24058171
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRYSTAL STRUCTURE; DIAGNOSTIC TECHNIQUES; ELECTRON DIFFRACTION; ELECTRON MICROSCOPES; IMAGE PROCESSING; IMAGES; PATTERN RECOGNITION; RESOLUTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; MICROSCOPES; SCATTERING