Published April 1992 | Version v1
Journal article

Image processing for crystal structure determination by high resolution electron microscopy imaging

Creators

  • 1. Academia Sinica, Beijing, BJ (China). Inst. of Physics

Description

A new approach to crystal structure determination based on a single high resolution electron microscope image and the corresponding electron diffraction pattern is introduced. This is, in fact, a kind of image processing by means of an electron diffraction analysis technique and contains two steps: image deconvolution and resolution enhancement. In the first step the image, taken under arbitrary de-focussed conditions, is transformed into the structure image; in the second step the image resolution is enhanced by a phase extension technique. The resolution of the final structure image exceeds the resolution limit of the electron microscopy

Additional details

Publishing Information

Journal Title
Wuli
Journal Volume
21
Journal Issue
4
Journal Page Range
p. 202-207.
ISSN
0379-4148
CODEN
WULIAL