Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy
Creators
- 1. Department of Materials Science and Engineering, North Carolina State University, 911 Partners Way Engineering Building 1, Raleigh, NC 27606 (United States)
- 2. School of Physics, University of Melbourne, Parkville, Victoria 3010 (Australia)
- 3. School of Physics and Astronomy, Monash University, Clayton, Victoria 3800 (Australia)
- 4. Department of Materials Science and Engineering, Monash University, Clayton, Victoria 3800 (Australia)
- 5. Monash Centre for Electron Microscopy, Monash University, Clayton, Victoria 3800 (Australia)
Description
Here we report the influence of key experimental parameters on atomically resolved energy dispersive X-ray spectroscopy (EDX). In particular, we examine the role of the probe forming convergence semi-angle, sample thickness, lattice spacing, and dwell/collection time. We show that an optimum specimen-dependent probe forming convergence angle exists to maximize the signal-to-noise ratio of the atomically resolved signal in EDX mapping. Furthermore, we highlight that it can be important to select an appropriate dwell time to efficiently process the X-ray signal. These practical considerations provide insight for experimental parameters in atomic resolution energy dispersive X-ray analysis. - Highlights: • Impacts of microscope operating conditions on EDX signal and atom column contrast are demonstrated. • Influence of sample thickness and lattice spacing is shown. • Conditions for obtaining optimal signal and contrast for different sample types are discussed. • Effects of dwell time during EDX acquisition are discussed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2016.08.013Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2016.08.013;
- PII
- S0304-3991(16)30146-2;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 171
- Journal Page Range
- p. 1-7
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48085961
- Subject category
- S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ATOMS; CONVERGENCE; ELECTRON CHANNELING; ELECTRONS; MICROSCOPES; PROBES; RESOLUTION; SIGNALS; SIGNAL-TO-NOISE RATIO; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY; X RADIATION; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHANNELING; DIMENSIONLESS NUMBERS; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; FERMIONS; IONIZING RADIATIONS; LEPTONS; MICROSCOPY; RADIATIONS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.