Published 1976 | Version v1
Miscellaneous Metadata-only

Compact interferometer for accurate determination of optical constants of thin films

Creators

  • 1. Technion-Israel Inst. of Tech., Haifa. Dept. of Electrical Engineering

Description

no abstract available

Additional details

Publishing Information

Imprint Title
1976 annual meeting
Journal Volume
22
Series
Bulletin of the Israel Physical Society.
Journal Page Range
p. 86-87.
Report number
INIS-mf--3516

Conference

Title
Israel Physical Society 1976 annual meeting.
Dates
11 - 12 Apr 1976.
Place
Haifa, Israel.

INIS

Country of Publication
Israel
Country of Input or Organization
Israel
INIS RN
8335445
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S42: ENGINEERING;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
FILMS; INTERFEROMETERS; OPTICAL PROPERTIES; THICKNESS
Descriptors DEC
DIMENSIONS; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES

Optional Information

Notes
Published in summary form only.