Refractive indices of (NH4)2SO4 crystals under uniaxial pressure
- 1. Franko National University of Lviv (Ukraine)
- 2. Koszalin University of Technology (Poland)
Description
The effect of uniaxial pressure σm ≤ 200 bar on the spectral (300-800 nm) and temperature (300-77 K) dependences of the refractive indices of(NH4)2SO4 crystals has been investigated. The baric dependences of the electronic polarizability, specific refraction, and parameters of the Sellmeier formula have been calculated. It is established that uniaxial pressure increases the refractive indices, mainly because of the narrowing of the band gap, increase in the oscillator density, and redshift of the UV absorption band maximum. The anomalies arising as a result of ferroelectric phase transition are related to the occurrence of spontaneous deformation and polarization (the latter is a superposition of two sublattice polarizations). The spectral and temperature dependences of the piezooptic constants are analyzed and the values of electro-optic coefficients are estimated.
Additional details
Identifiers
Publishing Information
- Journal Title
- Crystallography Reports
- Journal Volume
- 54
- Journal Issue
- 2
- Journal Page Range
- p. 313-319
- ISSN
- 1063-7745
- CODEN
- CYSTE3
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44010842
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMMONIUM SULFATES; CRYSTALS; DEFORMATION; ENERGY ABSORPTION; FERROELECTRIC MATERIALS; OSCILLATORS; PHASE TRANSFORMATIONS; POLARIZABILITY; POLARIZATION; RED SHIFT; REFRACTION; REFRACTIVE INDEX; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0065-0273 K; TEMPERATURE RANGE 0273-0400 K
- Descriptors DEC
- ABSORPTION; AMMONIUM COMPOUNDS; DIELECTRIC MATERIALS; ELECTRICAL PROPERTIES; ELECTRONIC EQUIPMENT; EQUIPMENT; MATERIALS; OPTICAL PROPERTIES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SORPTION; SULFATES; SULFUR COMPOUNDS; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2009 Pleiades Publishing, Ltd.