Published December 2012 | Version v1
Journal article

Luminescent properties of MBE-grown Si:Er/SOI structures

  • 1. Institute for Physics of Microstructures RAS, GSP-105, Nizhny Novgorod 603950 (Russian Federation)
  • 2. Physical-Technical Research Institute, University of Nizhny Novgorod, Gagarin Ave. 23/3, Nizhny Novgorod 603950 (Russian Federation)

Description

Here we report on luminescent properties of multilayer Si:Er structures grown by sublimation molecular-beam epitaxy on "silicon-on-insulator" substrates. We demonstrate formation in such structures of a unique erbium-related center Er-1. This optical complex stands out among other known erbium-related centers in silicon for its record narrow luminescent line (<10 μeV) and largest absorption cross-section and, therefore, provides the best conditions to achieve practically significant amplification and stimulated emission in erbium-doped silicon structures.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jlumin.2011.11.025

Additional details

Identifiers

DOI
10.1016/j.jlumin.2011.11.025;
PII
S0022-2313(11)00633-8;

Publishing Information

Journal Title
Journal of Luminescence
Journal Volume
132
Journal Issue
12
Journal Page Range
p. 3148-3150
ISSN
0022-2313
CODEN
JLUMA8

Conference

Title
Symposium on rare-earth doped semiconductors and nanostructures for photonics
Acronym
E-MRS fall 2011 meeting
Dates
19-23 Sep 2011
Place
Warsaw (Poland)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44109134
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; AMPLIFICATION; CROSS SECTIONS; DOPED MATERIALS; ERBIUM; LAYERS; LUMINESCENCE; MOLECULAR BEAM EPITAXY; SILICON; STIMULATED EMISSION; SUBLIMATION
Descriptors DEC
CRYSTAL GROWTH METHODS; ELEMENTS; EMISSION; ENERGY-LEVEL TRANSITIONS; EPITAXY; EVAPORATION; MATERIALS; METALS; PHASE TRANSFORMATIONS; PHOTON EMISSION; RARE EARTHS; SEMIMETALS; SORPTION

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.