Published April 2007 | Version v1
Journal article

Interface microstructure of MgB2/Al-AlOx/MgB2 Josephson junctions studied by cross-sectional transmission electron microscopy

  • 1. NTT Corp., NTT Basic Research Laboratories, Atsugi, Kanagawa (Japan)
  • 2. Tokyo Univ. of Agriculture and Technology, Dept. of Applied Physics, Tokyo (Japan)

Description

We investigated the interface microstructure of sandwich-type MgB2/Al-AlOx/MgB2 Josephson tunnel junctions by cross-sectional transmission electron microscopy (TEM) in order to clarify the non-idealities in the junction characteristics. The results indicate that there are poor-crystalline MgB2 layers and/or amorphous Mg-B composite layers of a few nanometers between the AlOx barrier and upper MgB2 layer. The poor-crystalline upper Mg-B layers seem to behave as normal metal or deteriorated superconducting layers, which may be the principal reason for all non-idealities of our MgB2/Al-AlOx/MgB2 junctions. (author)

Additional details

Publishing Information

Journal Title
Japanese Journal of Applied Physics. Part 2, Letters and Express Letters
Journal Volume
46
Journal Issue
12-16
Journal Page Range
p. L271-L273
ISSN
0021-4922

Optional Information

Notes
15 refs., 3 figs.