Published 1997
| Version v1
Book
Relaxation time measurements in Josephson junctions
- 1. Istituto di Ricerca sulle Onde Eletromagnetiche Nello Carrara, Frienze (Italy)
Description
We present an experimental method for obtaining a direct measurement of the lifetime of the zero-voltage state in Josephson junctions in the thermal regime. The range of the lifetime τd is comprised between 10-6-10-3 s. The experimental results are compared with theoretical predictions: this provides also a test of the effective temperature of the junction. The possibility of extending the procedure for the determination of other time-scale, such as those involved in quantum-Zeno effect and traversal time, are discussed. (author)
Additional details
Publishing Information
- Publisher
- World Scientific
- Imprint Place
- Singapore (Singapore)
- ISBN
- 981-02-2905-4
- Imprint Title
- Proceedings of the Adriatico research conference on tunneling and its implications
- Imprint Pagination
- 482 p.
- Journal Page Range
- p. 252-261
Conference
- Title
- Adriatico research conference on tunneling and its implications
- Dates
- 30 Jul - 2 Aug 1996
- Place
- Trieste (Italy)
INIS
- Country of Publication
- Singapore
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 29039793
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ELECTRIC CONDUCTIVITY; EXPERIMENTAL DATA; JOSEPHSON JUNCTIONS; LIFETIME; RELAXATION TIME
- Descriptors DEC
- DATA; ELECTRICAL PROPERTIES; INFORMATION; NUMERICAL DATA; PHYSICAL PROPERTIES; SEMICONDUCTOR JUNCTIONS
Optional Information
- Notes
- 10 refs, 9 figs