Structure and temperature dependent electrical properties of lead-free Bi0.5Na0.5TiO3- SrZrO3 ceramics
Creators
- 1. Engineering Research Center for Integrated Mechatronics Materials and Components, Changwon National University, Gyeongnam 641-773 (Korea, Republic of)
- 2. Korea Electrotechnology Research Institute, Gyeongnam 641-773 (Korea, Republic of)
Description
Lead-free SrZrO3-modified Bi0.5Na0.5TiO3 (BNT-SZ) ceramics were fabricated by a conventional solid state reaction method. X-ray diffraction analysis reveals a pure perovskite phase without any traces of secondary phases. Scanning electron microscopy images depicts dense grain morphology. The temperature dependences of the dielectric behavior was measured in the temperature range of 50-500 °C at 100 kHz. With the increase in SZ content, the dielectric constant (εr) constantly decreased and the maximum dielectric constant temperature (Tm) shifted towards lower temperatures. In addition to this, ferroelectric hysteresis loops indicated a disruption of ferroelectric order and increase in the relaxor character of BNT ceramics with increase in SZ concentration. A maximum values of remnant polarization (32 μC/cm2) and piezoelectric constant (100 pC/N) were observed at SZ5 and SZ4, respectively
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/60/1/012047Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 60
- Journal Issue
- 1
- Journal Page Range
- [9 p.]
- ISSN
- 1757-899X
Conference
- Title
- International symposium on advanced materials
- Acronym
- ISAM 2013
- Dates
- 23-27 Sep 2013
- Place
- Islamabad (Pakistan)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47067211
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CERAMICS; CONCENTRATION RATIO; FERROELECTRIC MATERIALS; KHZ RANGE; LEAD; PERMITTIVITY; PEROVSKITE; PIEZOELECTRICITY; POLARIZATION; SCANNING ELECTRON MICROSCOPY; SOLIDS; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; DIFFRACTION; DIMENSIONLESS NUMBERS; ELECTRICAL PROPERTIES; ELECTRICITY; ELECTRON MICROSCOPY; ELEMENTS; FREQUENCY RANGE; MATERIALS; METALS; MICROSCOPY; MINERALS; OXIDE MINERALS; PEROVSKITES; PHYSICAL PROPERTIES; SCATTERING