Elastic constants and dimensions of imprinted polymeric nanolines determined from Brillouin light scattering
Creators
- 1. Materials Reliability Division, National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305 (United States)
- 2. Polymers Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899 (United States)
- 3. Flexible Display Center, Arizona State University, Tempe, AZ 85284 (United States)
- 4. Department of Civil and Environmental Engineering, Colorado State University, Fort Collins, CO 80525 (United States)
Description
Elastic constants and cross-sectional dimensions of imprinted nanolines of poly(methyl methacrylate) (PMMA) on silicon substrates are determined nondestructively from finite-element inversion analysis of dispersion curves of hypersonic acoustic modes of these nanolines measured with Brillouin light scattering. The results for the cross-sectional dimensions, under the simplifying assumption of vertical sides and a semicircular top, are found to be consistent with dimensions determined from critical-dimension small-angle x-ray scattering measurements. The elastic constants C11 and C44 are found to be, respectively, 11.6% and 3.1% lower than their corresponding values for bulk PMMA. This result is consistent with the dimensional dependence of the quasi-static Young's modulus determined from buckling measurements on PMMA films with lower molecular weights. This study provides the first evidence of size-dependent effects on hypersonic elastic properties of polymers.
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/21/7/075703Additional details
Identifiers
- DOI
- 10.1088/0957-4484/21/7/075703;
- PII
- S0957-4484(10)38918-5;
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 21
- Journal Issue
- 7
- Journal Page Range
- [8 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43022245
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ELASTICITY; FILMS; FINITE ELEMENT METHOD; LIGHT SCATTERING; METHACRYLIC ACID ESTERS; MOLECULAR WEIGHT; NANOSTRUCTURES; PMMA; SILICON; SMALL ANGLE SCATTERING; SUBSTRATES; X-RAY DIFFRACTION; YOUNG MODULUS
- Descriptors DEC
- CALCULATION METHODS; CARBOXYLIC ACID ESTERS; COHERENT SCATTERING; DIFFRACTION; ELEMENTS; ESTERS; MATHEMATICAL SOLUTIONS; MECHANICAL PROPERTIES; NUMERICAL SOLUTION; ORGANIC COMPOUNDS; ORGANIC POLYMERS; POLYACRYLATES; POLYMERS; POLYVINYLS; SCATTERING; SEMIMETALS