Interdiffusion in Au-Ag* thin films
- 1. Instituto Militar de Engenharia, Rio de Janeiro (Brazil). Secao de Engenharia e Ciencia dos Materiais
- 2. Rio de Janeiro Univ. (Brazil). Coordenacao dos Programas de Pos-graduacao de Engenharia
- 3. Pontificia Univ. Catolica do Rio de Janeiro (Brazil)
Description
A study on the Au-Ag diffusion in the form of thin films, deposited over glass substrates, under high vacuum (10-5-10-6 torr) was carried out. Concentration profiles were obtained by Auger Electron Spectroscopy. Suzuoka's method was used to determine diffusion coefficients. Convolution studies to obtain concentration profiles were performed by Rutherford Ion Backscattering and data obtained were compared with those from the previously mentioned technique. Diffusion coefficients through grain boundaries between 1500-2500C ranged from 9.2 x 10-15 to 2.6 x 10-14 cm2/s while coefficients of diffusion through the net ranged from 3.3 x 10-17 to 1.8 x 10-16 cm2/s. Activation energies related to diffusion through boundary and net were, respectively, 0.21 eV and 0.40 eV. (C.L.B.)
Abstract (Portuguese)
Estudou-se a difusao de Au-Ag na forma de filmes finos, depositados a alto vacuo, 10-5-10-6 torr, sobre substratos de vidro. Os perfis de concentracao foram obtidos atraves da tecnica de Espectroscopia de Eletrons Auger. Utilizou-se o metodo de Suzuoka para determinacao dos coeficientes de difusao. Fez-se comparacao e estudo de convolucao na obtencao do perfil de concentracao atraves da tecnica de Retroespalhamento de Ions Rutherford. Os coeficientes de difusao pelo contorno de grao obtidos, no intervalo de temperatura de 1500-2500C, variaram de 9,2 x 10-15 a 2,6 x 10-14 cm2/s, enquanto que o coeficiente de difusao atraves da rede, de 3,3 x 10-17 a 1,8 x 10-16 cm2/s. Foram obtidas as energias de ativacao relacionadas a difusao pelo contorno e pela rede, respectivamente de 0,21 eV e 0,40 eV. (Autor)Additional details
Additional titles
- Original title (Portuguese)
- Interdifusao em filmes finos de Au-Ag*
Publishing Information
- Journal Title
- Rev. Bras. Apl. Vacuo
- Journal Volume
- 3
- Journal Issue
- 1-2
- Series
- Rev. Bras. Apl. Vacuo.
- Journal Page Range
- 213-222
- ISSN
- 0101-7659
Conference
- Title
- 4. Brazilian Congress of Vacuum Applications in the Industry and in the Science.
- Dates
- 18-20 Jul 1983.
- Place
- Sao Jose dos Campos, SP (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 16016878
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AUGER ELECTRON SPECTROSCOPY; DIAGRAMS; DIFFUSION; FILMS; GOLD; GRAIN BOUNDARIES; RUTHERFORD SCATTERING; SILVER; VACUUM COATING
- Descriptors DEC
- CRYSTAL STRUCTURE; DEPOSITION; ELASTIC SCATTERING; ELECTRON SPECTROSCOPY; ELEMENTS; INFORMATION; METALS; MICROSTRUCTURE; SCATTERING; SPECTROSCOPY; SURFACE COATING; TRANSITION ELEMENTS